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Quantitative Analysis of Defects in Silicon-Characterization of UCP, HAMCO, and Microcrystalline Material, by J. Dunn, R. M. Cohen, G. B. Stringfellow, R. Natesh, 1985 January

Level of Description

File

Date

1985 January

Container

Box 38: Series IV.,
To request this item in person:
Collection Number: MS-00091
Collection Name: Yucca Mountain Site Characterization Office Collection
Box/Folder: Box 38
English